The Behaviour and Frequency-Dependent Parameters of the CNT-Covered Films in the Frequency Range of 50MHz – 6.2GHz
Lagashkin, Ruslan (2016)
Creative Commons Attribution 3.0 Unported
Julkaisun pysyvä osoite on
Theoretical basis for the frequency-dependent parameters measurement and calculation for the thin film conductive materials is described. The single layer and multilayer CNT-covered film disks were installed across the coaxial cable line and then short circuited. It was found that the resonant frequencies of the system are inversely proportional to the segment of the coaxial line length between the installed disks and the short circuiter. The resonant frequencies caused the attenuation due to the destructive interference up to -36dB. The Corbino disk reflectometry setup using a clutch device was used to measure the CNT-covered film complex load impedance ZL at the frequencies of 50 MHz, 860 MHz, 2.45 GHz, 5 GHz and 6.2 GHz. ZL was then used to calculate the film complex surface impedance Zs and the conductivity σ. The way to predict the thin film complex frequency-dependent surface impedance and surface impedance based on the DC Ω/□ measurement was found. The way to calculate most of the frequency-dependent thin film parameters based on the ZL is described.