Hardware Optimization of Automated Test Setup for Current and Piezo Measurements
Stenmans, Andre (2023)
Julkaisun pysyvä osoite on
https://urn.fi/URN:NBN:fi:amk-2023121236280
https://urn.fi/URN:NBN:fi:amk-2023121236280
Tiivistelmä
This thesis presents the optimization of an automated test setup’s hardware side. The purpose of the test setup is to confirm the functionality of firmware updates and modifications in Aito Interactive Oy products. The goal of this project was to create a reliable testing environment with uncomplicated error searching and trustworthy results.
The optimization concentrated on creating a PCB, which provides reliable connections between components and other boards included in the test setup. Key methods included analyzing the previous test setup and addressing its issues in the new design, as well as selecting components to enhance reliability and consistency.
The optimized test setup demonstrated functionality and reliability compared to the previous test setup. The test results obtained by both test setups did not differ in any meaningful way, which confirms the correct hardware functionality of the optimized test setup. The addition of connectors and the minimization of jumper wires reduced uncertainties in connections.
The optimized test setup lays the fundamental brick for a reliable testing environment in which the test results can be trusted and used for error analysis. Further optimizations could include additional measurement circuits and more precise measuring techniques. These improvements could allow the test setup to be used for other purposes like quality assurance.
The optimization concentrated on creating a PCB, which provides reliable connections between components and other boards included in the test setup. Key methods included analyzing the previous test setup and addressing its issues in the new design, as well as selecting components to enhance reliability and consistency.
The optimized test setup demonstrated functionality and reliability compared to the previous test setup. The test results obtained by both test setups did not differ in any meaningful way, which confirms the correct hardware functionality of the optimized test setup. The addition of connectors and the minimization of jumper wires reduced uncertainties in connections.
The optimized test setup lays the fundamental brick for a reliable testing environment in which the test results can be trusted and used for error analysis. Further optimizations could include additional measurement circuits and more precise measuring techniques. These improvements could allow the test setup to be used for other purposes like quality assurance.